X-Ray Residual Stress Measurement on Weld Metal of Nickel Based Alloy

X-ray reflectivity studies of liquid metal and alloy surfaces

Surface-induced atomic layering at the liquid/vapor interface in liquid metals has been observed using x-ray reflectivity on sputtered clean surfaces under ultrahigh vacuum conditions. A well-defined quasi-Bragg peak is obtained for surfaces of elemental Ga and a Ga-In alloy at large wave vectors qz;2.3–2.5 Å . These results are an unambiguous indication of atomic layering with an interlayer sp...

I / RESIDUAL STRESS DISTRIBUTION IN FeAl WELD OVERLAY ON STEEL

Neutron diffraction was used to measure the residual stress distribution in an FeAl weld overlay on steel. It was found that the residual stresses accumulated during welding were essentially removed by the post-weld heat treatment that was applied to the specimen; most residual stresses in the specimen developed during cooling following the post-weld heat treatment. The experimental data were c...

X-ray Stress Measurement of Nickel-base Single Crystal Superalloy Using Two-dimensional Detector

The stress in a single crystal of nickel-base superalloy with 72 % volume fraction of '-phase was measured by the X-ray method. The specimen whose surface normal was parallel to [001] direction was oscillated around -axis during recording of the X-ray diffraction pattern with a two-dimensional position sensitive proportional counter (PSPC). The stress was determined from the measured strain u...

Measurement of Residual Stresses in Fiber Reinforced Composites Based on X-Ray Diffraction

1. ABSTRACT X-ray diffraction (XRD) measurements have been made to determine residual stresses in embedded Al particles placed between the first and second ply of both unidirectional and fabric graphite/PMR-15 composite specimens. In order to further verify the results obtained, the effect of externally applied four-point bending on the measured strains and stresses in the Al inclusions was inv...

Recent Advances in the Measurement of Residual Stress by X-Ray Diffraction